Wavefront shaping concepts for application in optical coherence tomography - a review

Optical coherence tomography (OCT) enables three-dimensional imaging with resolution on the micrometer scale. The technique relies on the time-of-flight gated detection of light scattered from a sample and has received enormous interest in applications as versatile as non-destructive testing, metrology and non-invasive medical diagnostics. However, in strongly scattering media such as biological tissue, the penetration depth and imaging resolution are limited. Combining OCT imaging with wavefront shaping approaches significantly leverages the capabilities of the technique by controlling the scattered light field through manipulation of the field incident on the sample. This article reviews the main concepts developed so far in the field and discusses the latest results achieved with a focus on signal enhancement and imaging. © 2020 by the authors. Licensee MDPI, Basel, Switzerland

Double Interferometer Design for Independent Wavefront Manipulation in Spectral Domain Optical Coherence Tomography

Spectral domain optical coherence tomography (SD-OCT) is a highly versatile method which allows for three dimensional optical imaging in scattering media. A number of recent publications demonstrated the technique to benefit from structured illumination and beam shaping approaches, e.g. to enhance the signal-to-noise ratio or the penetration depth with samples such as biological tissue. We present a compact and easy to implement design for independent wavefront manipulation and beam shaping at the reference and sample arm of the interferometric OCT device. The design requires a single spatial light modulator and can be integrated to existing free space SD-OCT systems by modifying the source arm only. We provide analytical and numerical discussion of the presented design as well as experimental data confirming the theoretical analysis. The system is highly versatile and lends itself for applications where independent phase or wavefront control is required. We demonstrate the system to be used for wavefront sensorless adaptive optics as well as for iterative optical wavefront shaping for OCT signal enhancement in strongly scattering media. © 2019, The Author(s)

Transient sub-nanosecond soft X-ray NEXAFS spectroscopy on organic thin films

We demonstrate visible pump soft X-ray probe near-edge X-ray absorption fine structure (NEXAFS) spectroscopy measurements at the carbon K edge on thin molecular films in the laboratory. This opens new opportunities through the use of laboratory equipment for chemical speciation. We investigate the metal-free porphyrin derivative tetra(tert-butyl)porphyrazine as an ideal model system to elucidate electronic properties of tetrapyrroles like chlorophyll or heme. In contrast to measurements in gas or liquid state, the investigation of thin films is of high interest in the field of optoelectronic and photovoltaic devices though challenging due to the low damage thresholds of the samples upon excitation. With a careful pre-characterization using optical techniques, successful measurements were performed using a NEXAFS spectrometer based on a laser-produced plasma source and reflection zone plates with a resolving power of 1000 and a time resolution of 0.5 ns. In combination with density functional theory calculations, first insights into a long-lived excitonic state are gained and discussed.DFG, 313838950, Neuartiges Laborspektrometer für Pump-Probe NEXAFS-Untersuchungen an Biomolekülen in wässriger Lösun

Scan Free GEXRF in the Soft X ray Range for the Investigation of Structured Nanosamples

Scan free grazing emission X ray fluorescence spectroscopy GEXRF is an established technique for the investigation of the elemental depth profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan free GEXRF is applied in proof of concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X ray range. The sample investigated is a Si3N4 lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy dispersive spectra are obtained via single photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite elements method. A first measurement is carried out at the UE56 2 PGM 2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X ray range. Furthermore, a laser produced plasma source LPP is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan free GEXRF in the soft X ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laborator

Wavefront Shaping Concepts for Application in Optical Coherence Tomography—A Review

Optical coherence tomography (OCT) enables three-dimensional imaging with resolution on the micrometer scale. The technique relies on the time-of-flight gated detection of light scattered from a sample and has received enormous interest in applications as versatile as non-destructive testing, metrology and non-invasive medical diagnostics. However, in strongly scattering media such as biological tissue, the penetration depth and imaging resolution are limited. Combining OCT imaging with wavefront shaping approaches significantly leverages the capabilities of the technique by controlling the scattered light field through manipulation of the field incident on the sample. This article reviews the main concepts developed so far in the field and discusses the latest results achieved with a focus on signal enhancement and imaging

Single shot near edge x ray absorption fine structure spectroscopy in the laboratory

With the help of adapted off axis reflection zone plates, near edge X ray absorption fine structure spectra at the C and N K absorption edge have been recorded using a single 1.2 ns long soft X ray pulse. The transmission experiments were performed with a laser produced plasma source in the laboratory rendering time resolved measurements feasible independent on large scale facilities. A resolving power of E DE 950 at the respective edges could be demonstrated. A comparison of single shot spectra with those collected with longer measuring time proves that all features of the used reference samples silicon nitrate and polyimide can be resolved in 1.2 ns. Hence, investigations of radiation sensitive biological specimen become possible due to the high efficiency of the optical elements enabling low dose experiment

Laboratory GIXRF as a tool for fast screening of stratified samples with sub-nanometer thickness -- the example of CrSc multilayer water window optics

Efficient multilayer optics for radiation in the water window range are difficult to manufacture due to extremely small layer thicknesses and severe intermixing of elements between the layers. Therefore, adequate analytics and short feedback loops are of utmost importance for manufacturers to improve performance and efficiency. We show the possibility for non-destructive elemental depth profiling with commercial laboratory equipment using four real-life CrSc multilayer samples. Comparative measurements at the laboratory of PTB at the synchrotron radiation facility BESSY II validate the results and prove the potential of laboratory equipment for the fast and reliable analysis of stratified materials with sub-nanometer layer thicknesses